Evaluation of Free Carrier Lifetime and Deep Levels of the Thick 4H-SiC Epilayers
- 15 June 2004
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 457-460, 565-568
- https://doi.org/10.4028/www.scientific.net/msf.457-460.565
Abstract
No abstract availableKeywords
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