Spectra ofx rays from 64-MeV sulfur ions traveling in solids
- 1 August 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 22 (2) , 582-590
- https://doi.org/10.1103/physreva.22.582
Abstract
Spectra of x rays from 64-MeV sulfur ions incident on a wide range of thick elemental targets have been measured with a plane crystal spectrometer. Various features of the spectra were found to be sensitive to the atomic structure of the targets. In particular, the satellite and hypersatellite intensity distributions displayed oscillatory variations ∼ 14% as a function of target atomic number. This behavior is satisfactorily accounted for by the systematics of electron-capture cross sections. Considerable line broadening was observed, and the Lorentzian component of the total linewidth was found to increase linearly with the product of the target atomic number and the atomic concentration.
Keywords
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