Transport Properties of Carriers at Oxide-Hg1-xCdxTe Interface
- 1 January 1981
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Oxide and interface properties of anodic films on Hg1−xCdxTeJournal of Vacuum Science and Technology, 1980
- HgCdTe charge-coupled device technology∗Infrared Physics, 1980
- Hg0.7Cd0.3Te charge-coupled device shift registersApplied Physics Letters, 1978
- Plasma‐Grown Oxide on GaAs: Semiquantitative Chemical Depth Profiles Obtained Using Auger Spectroscopy and Neutron Activation AnalysisJournal of the Electrochemical Society, 1978
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962