Delayed Luminescence of theMCenter inF−to−MConversion in NaF

Abstract
A "delayed luminescence" has been observed in x-irradiated NaF samples after bleaching with F light near room temperature. The delayed luminescence (D.L.) is attributed to the latent formation of M centers in their excited state and their subsequent luminescence. An analysis of the decay of this D.L. indicates that there are two types of migrating center involved in FtoM conversion, corresponding to two competing optical bleaching processes. It is proposed that these two migrating centers are (α,α̃) centers (vacancy pairs) and α centers (anion vacancies). The activation energies for individual migrating centers are found from the temperature dependence of the exponential decay of the D.L. to be E1=0.75±0.02 eV and E2=0.77±0.08 eV. The temperature dependence of the time constant for the growth of the D.L. when the F light is turned on indicates that the activation energy for FtoM conversion is Eg=0.62±0.02 eV.