A Bayes Reliability Growth Model for A Development Testing Program
- 1 December 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-36 (5) , 568-572
- https://doi.org/10.1109/tr.1987.5222474
Abstract
The problem of estimating the reliability of a system during development is considered. The development process has several stages at each stage binomial test data are obtained by testing a number of such systems on a success/fail basis. Marginal posterior distributions are derived under the assumption that the development process constrains the reliabilities to be nondecreasing and that the prior distribution for reliability at each stage is uniform. Simulation models are designed to facilitate testing for the validity and computation of the Bayesian model with ordered reliabilities as well as to compare results with other reliability growth models.Keywords
This publication has 6 references indexed in Scilit:
- A Bayesian Note on Reliability Growth During a Development Testing ProgramIEEE Transactions on Reliability, 1977
- A Remark on the Barlow-Scheuer Reliability Growth Estimation SchemeTechnometrics, 1971
- An empirical Bayes smoothing techniqueBiometrika, 1969
- Reliability Growth during a Development Testing ProgramTechnometrics, 1966
- The Empirical Bayes Approach to Statistical Decision ProblemsThe Annals of Mathematical Statistics, 1964
- An Empirical Distribution Function for Sampling with Incomplete InformationThe Annals of Mathematical Statistics, 1955