Modeling the effects of write field rise time on the recording properties in thin film media
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 32 (1) , 61-66
- https://doi.org/10.1109/20.477551
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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