Effect of gold on surface properties and leakage current of MOS transistors
- 30 September 1967
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 10 (9) , 891-896
- https://doi.org/10.1016/0038-1101(67)90002-0
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
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