X-ray photoelectron diffraction from a free-electron-metal valence band: Evidence for hole-state localization
- 28 May 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 64 (22) , 2683-2686
- https://doi.org/10.1103/physrevlett.64.2683
Abstract
X-ray-photoelectron diffraction has been measured from an Al(001) single crystal for the free-electron-like valence band and the well-localized 2s core level, using Mg Kα radiation. Both show the same high anisotropy of 65% in the azimuthal distribution of the photoemitted electrons at 45° away from the surface normal. Moreover, the measured intensity patterns are essentially identical, indicating a strong similarity in the photoemission final states. This similarity provides evidence for a strong degree of hole localization in high-energy valence-band photoemission.Keywords
This publication has 30 references indexed in Scilit:
- The analysis of photoelectron diffraction data obtained with fixed geometry and scanned photon energySurface Science, 1987
- Photoelectron diffractionPhysica Scripta, 1987
- Theory of angle-resolved photoemission extended fine structurePhysical Review B, 1986
- X-ray photoelectron and Auger-electron forward scattering: A new tool for studying epitaxial growth and core-level binding-energy shiftsPhysical Review B, 1984
- Angle-resolved x-ray photoelectron spectroscopyProgress in Surface Science, 1984
- x-ray absorption in aluminumPhysical Review B, 1980
- Self-consistent energy bands in aluminum: An improved calculationPhysical Review B, 1977
- Angular-dependent x-ray-photoelectron peak intensities from single-crystal goldPhysical Review B, 1977
- High-Energy Band Structure of AlPhysical Review B, 1970
- Angular Distribution of Electrons in ESCA Spectra from a Single CrystalPhysica Scripta, 1970