Birefringence imaging with imperfect benches: application to large-scale birefringence measurements.
- 1 August 2000
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 39 (22) , 3864-3874
- https://doi.org/10.1364/ao.39.003864
Abstract
We describe a birefringence measurement bench that allows fast two-dimensional measurements of low-birefringence fields in large transparent samples. We present calculations that show that, even when a birefringence bench exhibits defects (nonideal components, misalignments, etc.), measurements can be performed under realistic conditions without any a priori knowledge of the origin of the bench defects. This allows the measurement of birefringence fields on large-scale samples by use of an array of detectors instead of a single detector element, with a sensitivity of 3 × 10-4 rad for 2-s data integration.Keywords
This publication has 7 references indexed in Scilit:
- A new instrument for measuring both the magnitude and angle of low level linear birefringenceReview of Scientific Instruments, 1999
- Two-dimensional measurement technique for birefringence vector distributions: data processing and experimental verificationApplied Optics, 1999
- Two-dimensional measurement technique for birefringence vector distributions: measurement principleApplied Optics, 1999
- Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces.Optics Letters, 1999
- Roughness measurements in the picometric range using a polarization interferometer and a multichannel lockin detection techniqueInternational Journal of Machine Tools and Manufacture, 1998
- Picometric profilometry. II. Multidetector approach and multiplexed lock-in detectionJournal of Optics, 1995
- Sensitive devices to determine the state and degree of polarization of a light beam using a birefringence modulatorJournal of Optics, 1977