A deep-submicrometer MOSFET model for analog/digital circuit simulations

Publisher Website

6 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1988.32766

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Deep-submicrometer MOS device fabrication using a photoresist-ashing technique
IEEE Electron Device Letters, 1988
Generalized scaling theory and its application to a ¼ micrometer MOSFET design
IEEE Transactions on Electron Devices, 1984