Strain-controlled Si-Ge modulation-doped FET with ultrahigh hole mobility
- 1 February 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 12 (2) , 71-73
- https://doi.org/10.1109/55.75707
Abstract
A novel modulation-doped field effect transistor (MODFET) with a strain-controlled Ge channel, p-Si/sub 0.5/Ge/sub 0.5//Ge/Si/sub 1-x/Ge/sub x/, is fabricated by molecular beam epitaxy (MBE). In order to enlarge the valence-band discontinuity, strain at the p-Si/sub 0.5/Ge/sub 0.5//Ge interface is controlled by changing the composition of the relaxed Si/sub 1-x/Ge/sub x/ layer. For this MODFET operated at around 77 K, an ultrahigh-field-effect mobility of approximately 9000 cm/sup 2//V-s is obtained.<>Keywords
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