Spontaneous fluctuations in the leakage current due to charge generation and recombination in semiconductor diodes
- 31 December 1966
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 9 (11-12) , 1067-1073
- https://doi.org/10.1016/0038-1101(66)90130-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Noise figure and figure of merit for nuclear-radiation detectorsElectronics Letters, 1966
- Accurate noise measurements on transistorsIRE Transactions on Electron Devices, 1962
- Leakage current in semiconductor junction radiation detectors and its influence on energy-resolution characteristicsNuclear Instruments and Methods, 1961