Investigation of soft upsets in integrated circuit memories and charge collection in semiconductor test structures by the use of an ion microbeam
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 625-631
- https://doi.org/10.1016/0167-5087(83)91054-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Applications of a Microbeam to the Problem of Soft Upsets in Integrated Circuit MemoriesIEEE Transactions on Nuclear Science, 1983
- Collection of Charge on Junction Nodes from Ion TracksIEEE Transactions on Nuclear Science, 1982
- Charge Collection Measurements for Energetic Ions in SiliconIEEE Transactions on Nuclear Science, 1982
- Alpha-particle-induced field and enhanced collection of carriersIEEE Electron Device Letters, 1982
- Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliabilityIEEE Transactions on Electron Devices, 1979
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979