Effect of magnetic annealing on plated permalloy and domain configurations in thin-film inductive head
- 1 November 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 27 (6) , 4452-4457
- https://doi.org/10.1109/20.278660
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- A new high-precision optical technique to measure magnetostriction of a thin magnetic film deposited on a substrateIEEE Transactions on Magnetics, 1989
- Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal historyIEEE Transactions on Electron Devices, 1987
- Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniquesJournal of Materials Research, 1986
- The microstructure of sputter‐deposited coatingsJournal of Vacuum Science & Technology A, 1986
- Magnetic domain imaging with a scanning Kerr effect microscopeIEEE Transactions on Magnetics, 1986
- Thermal stability of magnetic properties of electroplated Ni -Fe-In ternary alloy filmsIEEE Transactions on Magnetics, 1986
- The saturation magnetostriction of permalloy filmsJournal of Applied Physics, 1981
- Anisotropy Spectrum in Electrodeposited Permalloy Thin FilmsJapanese Journal of Applied Physics, 1973
- Stray‐Field‐Free Magnetization ConfigurationsPhysica Status Solidi (b), 1969
- On the origin of uniaxial anisotropy in permalloy thin filmsIEEE Transactions on Magnetics, 1968