A novel vacuum electron source based on ballistic electron emission
- 1 February 1997
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 111, 165-169
- https://doi.org/10.1016/s0169-4332(96)00735-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ballistic-electron emission microscopy (BEEM): studies of metal/semiconductor interfaces with nanometer resolutionPhysics Reports, 1995
- Ballistic-electron emission into vacuum from a scanning-tunneling-microscope tip through free-standing gold filmsPhysical Review B, 1994
- Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopyPhysical Review Letters, 1988
- Current density distribution in a chromatically limited electron microprobeJournal of Vacuum Science & Technology B, 1986
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979