Sharp-Line Photoluminescence in ZnSi
- 15 June 1970
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 1 (12) , 4677-4686
- https://doi.org/10.1103/physrevb.1.4677
Abstract
We have studied the photoluminescence spectra of ZnSi. Time-resolved spectra, time decays of different spectral components, and excitation-intensity dependence studies were performed at various temperatures between 1.8 and 250°K. We observe a series of sharp emission lines (half-width ∼ 1 meV) which we attribute to phonon-assisted processes of an unidentified transition involving impurities or defects. Superimposed on this series is a featureless broad emission band. At energies above this series of lines, several other independent sharp lines are observed. Some of the latter are strongly enhanced as the temperature increases from 1.8 to 35°K. These results are discussed and compared with somewhat similar spectra of GaP.
Keywords
This publication has 7 references indexed in Scilit:
- Recombination Radiation Spectra in ZnSiP2 CrystalsPhysica Status Solidi (b), 1969
- Temperature-Dependent Radiative Recombination Mechanisms in GaP (Zn,O) and GaP (Cd,O)Physical Review B, 1968
- Optical Properties of Cd-O and Zn-O Complexes in GaPPhysical Review B, 1968
- New Red Pair Luminescence from GaPPhysical Review B, 1968
- Growth of some single crystal II–IV–V2 semiconducting compoundsJournal of Crystal Growth, 1968
- Semiconducting AIIBIVC CompoundsPhysica Status Solidi (b), 1967
- Bound Excitons in GaPPhysical Review B, 1963