High Electric Field Breakdown of 4H-SiC PN Junction Diodes
- 1 January 1996
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A simple edge termination for silicon carbide devices with nearly ideal breakdown voltageIEEE Electron Device Letters, 1994
- High-voltage (>1 kV) SiC Schottky barrier diodes with low on-resistancesIEEE Electron Device Letters, 1993
- 6H-silicon carbide devices and applicationsPhysica B: Condensed Matter, 1993
- Silicon-carbide high-voltage (400 V) Schottky barrier diodesIEEE Electron Device Letters, 1992
- High-voltage 6H-SiC p-n junction diodesApplied Physics Letters, 1991