Enhanced field evaporation by gas impact and field-ion microscopy of $\beta$ silicon carbide and lanthanum hexaboride
- 1 January 1969
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (1) , 106-107
- https://doi.org/10.1088/0022-3735/2/1/432
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Field ion microscopy of refractory metal carbidesPhilosophical Magazine, 1968
- Field-ion Microscopy of Titanium CarbidePhilosophical Magazine, 1967
- Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory MetalsJournal of Applied Physics, 1965
- The effect of polarization, field stress, and gas impact on the topography of field evaporated surfacesSurface Science, 1964
- Current-voltage characteristics of the helium field-ion microscopePhilosophical Magazine, 1963