Characteristics of secondary electron emission from CsI induced by x rays with energies up to 100 keV
- 15 December 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (12) , 7506-7509
- https://doi.org/10.1063/1.354975
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Properties of CsI-based gaseous secondary emission X-ray imaging detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1993
- Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electronsJournal of Applied Physics, 1992
- New approaches to spectroscopy and imaging of ultrasoft-to-hard X-raysNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991
- Increased secondary electron yield from thin CsI coatingsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92Atomic Data and Nuclear Data Tables, 1988
- The characterisation of soft X-ray transmission photocathodesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- The characterisation of soft X-ray photocathodes in the wavelength band 1–300 Å: I. Lead glass, lithium fluoride and magnesium fluorideNuclear Instruments and Methods in Physics Research, 1983
- The characterization of x-ray photocathodes in the 0.1–10-keV photon energy regionJournal of Applied Physics, 1981
- Atomic electron binding energiesAtomic Data and Nuclear Data Tables, 1979