Residual stress in coated low-z films of TiC and TiN: II. correlation of residual stress with microstructure
- 2 May 1984
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 123 (1-3) , 1315-1319
- https://doi.org/10.1016/0022-3115(84)90261-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Characterization of TiB2 coated layer by X-ray lattice constant measurementJournal of Nuclear Materials, 1981
- Performance of Tic-coated graphite in electron beam tests and doublet III operationJournal of Nuclear Materials, 1981
- Precision Determination of Lattice Constants with a Geiger-Counter X-Ray DiffractometerPhysical Review B, 1955