Characterization of TiB2 coated layer by X-ray lattice constant measurement
- 31 December 1981
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 103, 267-271
- https://doi.org/10.1016/0022-3115(82)90609-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Internal stresses in metallic films deposited by cylindrical magnetron sputteringThin Solid Films, 1979
- Intrinsic stress of magnetron-sputtered niobium filmsThin Solid Films, 1979
- Internal Stress of Evaporated Thin Gold FilmsJapanese Journal of Applied Physics, 1965
- Elastic Constants of TiC and TiB2Journal of Applied Physics, 1961
- Precision Determination of Lattice Constants with a Geiger-Counter X-Ray DiffractometerPhysical Review B, 1955