Electron beam effects in Auger electron spectroscopy and scanning electron microscopy
- 1 December 1979
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 1 (6) , 196-203
- https://doi.org/10.1002/sia.740010606
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A comparison of carbon contaminant buildup on conductors and insulators in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1978
- Auger microanalysis in a conventional scanning electron microscopeScanning, 1978
- Enhanced diffusion mechanismsRadiation Effects, 1978
- Low beam current density Auger spectroscopy and surface analysisSurface Science, 1977
- Beam effects in Auger electron spectroscopy analysis of titanium oxide filmsJournal of Vacuum Science and Technology, 1977
- AES compositional profiles of mobile ions in the surface region of glassJournal of Vacuum Science and Technology, 1976
- Electronic Structure and Reactivity of Metal SurfacesPublished by Springer Nature ,1976
- Beam effects in AES revealed by XPSFaraday Discussions of the Chemical Society, 1975
- A New Technique for Auger Analysis of Surface Species Subject to Electron-Induced DesorptionReview of Scientific Instruments, 1973
- Interaction of 25 keV Electrons with the Nucleic Acid Bases, Adenine, Thymine, and Uracil. I. Outer Shell ExcitationThe Journal of Chemical Physics, 1972