Abstract
Measurements on evaporated thin films of supercondutors provide a powerful technique for studying stress effects on the superconductivity transition. Utilization of the differential thermal expansion of film and substrate by suitable choice of substrate and substrate temperature during evaporation provides a convenient way for controlling the stress in the films. In this manner, uniform tensile and compressive stresses of substantial magnitude can be obtained and are tolerable because of the great strength of thin films. To illustrate how this technique can be used, studies are shown of similarity effects in indium films under the influence of biaxial stress and a generalization of the usual similarity relations is suggested.

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