Theoretical analysis of scanning near‐field optical microscopy
- 1 November 1994
- Vol. 16 (6) , 333-342
- https://doi.org/10.1002/sca.4950160604
Abstract
No abstract availableKeywords
This publication has 40 references indexed in Scilit:
- Optical Binding in Scanning Probe MicroscopyEurophysics Letters, 1994
- Macroscopic self-consistent model for external-reflection near-field microscopyJournal of the Optical Society of America A, 1993
- Combination of a Fiber and a Silicon Nitride Tip as a Bifunctional Detector; First Results and PerspectivesPublished by Springer Nature ,1993
- Direct Measurement of the Field Enhancement Caused by Surface Plasmons with the Scanning Tunneling Optical MicroscopePublished by Springer Nature ,1993
- Imaging of submicron index variations by scanning optical tunnelingJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- Resolution of the photon scanning tunneling microscope: influence of physical parametersUltramicroscopy, 1992
- Inductive forces generated by evanescent light fields: application to local probe microscopyOptics Communications, 1992
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991
- Scanning tunneling optical microscopyOptics Communications, 1989
- Surface-enhanced second-harmonic generation and Raman scatteringPhysical Review B, 1983