Experimental evaluation of large-signal modeling assumptions based on vector analysis of bias-dependent S-parameter data from MESFETs and HEMTs

This publication has 2 references indexed in Scilit:

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  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1991
• Bias dependence of the MODFET intrinsic model elements values at microwave frequencies
  IEEE Transactions on Electron Devices, 1989