Transient solutions of a software reliability model with imperfect debugging and error generation
- 1 April 1992
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 32 (4) , 475-478
- https://doi.org/10.1016/0026-2714(92)90475-z
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Optimal release policies for a flexible software reliability growth modelReliability Engineering & System Safety, 1992
- Optimum release policy for an inflection s-shaped software reliability growth modelMicroelectronics Reliability, 1991
- Software reliability analysis modelsIBM Journal of Research and Development, 1984
- S-Shaped Reliability Growth Modeling for Software Error DetectionIEEE Transactions on Reliability, 1983
- Software reliability models: A reviewMicroelectronics Reliability, 1983
- Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: A surveyMicroelectronics Reliability, 1983
- Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-DesignsIEEE Transactions on Reliability, 1981
- Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance MeasuresIEEE Transactions on Reliability, 1979
- An Empirical Stopping Rule for Debugging and Testing Computer SoftwareJournal of the American Statistical Association, 1977
- A theory of software reliability and its applicationIEEE Transactions on Software Engineering, 1975