The surface analysis of insulators by SIMS: Charge neutralization and stabilization of the surface potential

This publication has 8 references indexed in Scilit:

• Secondary ion mass spectrometry as a means of surface analysis
  Surface Science, 1979
• The sputtering processes during 6 kev Xe ion beam bombardment of halides
  Radiation Effects, 1978
• Energy distributions of atoms sputtered from alkali halides by 540 eV electrons
  Radiation Effects, 1978
• The use of secondary ion mass spectrometry for studies of oxygen adsorption and oxidation
  Surface Science, 1977
• Oxygen adsorption on molybdenum studied by low-energy secondary-ion mass spectrometry and electron-induced desorption
  Physical Review B, 1977
• Desorption methods as probes of kinetics and bonding at surfaces
  Surface Science, 1977
• Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron Spectroscopy
  Applied Physics Letters, 1972
• Secondary Electron Emission from Solids
  Published by Elsevier ,1959