Heavy ion-induced characteristic X-rays as a tool in solid state physics
- 15 April 1971
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 92 (4) , 507-510
- https://doi.org/10.1016/0029-554x(71)90104-2
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- The location of impurity atoms in crystals using characteristic x-ray generation by channelled protonsPhysics Letters A, 1968
- X-Ray Production in theShell of Copper by 25- to 1700-eV ProtonsPhysical Review B, 1966
- Studies in X-Ray Production by Proton Bombardment of C, Mg, Al, Nd, Sm, Gd, Tb, Dy, and HoPhysical Review B, 1965
- Interpretation of-Ar Collisions at 50 KeVPhysical Review Letters, 1965
- Effect of Channeling of Low-Energy Protons on the Characteristic X-Ray Production in Single CrystalsPhysical Review Letters, 1965
- Characteristic X-Ray Production in theShell of Copper by Low-Energy (100- to 500-keV) ProtonsPhysical Review B, 1964