TECHNICAL NOTE Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity
- 1 December 1996
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 35 (34) , 6740-6743
- https://doi.org/10.1364/ao.35.006740
Abstract
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