Thermally actuated microprobes for a new wafer probe card
- 1 March 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Microelectromechanical Systems
- Vol. 8 (1) , 43-49
- https://doi.org/10.1109/84.749401
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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