A micromachined array probe card-fabrication process
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
- Vol. 18 (1) , 179-183
- https://doi.org/10.1109/96.365506
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Array probe cardPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Bare die testing and MCM probing techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Bare die testPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Micro-machined array probe cardPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992