Effective thermal conductivity analysis of 1.55 μm InGaAsP/InP vertical-cavity top-surface-emitting microlasers

27 May 1993

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 29 (11) , 1015-1016
https://doi.org/10.1049/el:19930677

Abstract

An analytical approach is developed and appoied to investigate the thermal properties of 1.55 μm microresonator vertical-cavity surface-emitting lasers (VCSELs) mounted substrate-down. The results indicate that difficulties with obtaining the CW operation of long-wavelength VCSELs are primarily associated with intrinsic properties (such as low T₀) rather than with their thermal resistance.

Keywords

1.55 MICRON
THERMAL RESISTANCE
LONG-WAVELENGTH
TOP-SURFACE-EMITTING MICROLASERS
INGAASP-INP
VERTICAL-CAVITY
SUBSTRATE-DOWN MOUNTING
THERMAL CONDUCTIVITY ANALYSIS
CW OPERATION
THERMAL PROPERTIES
MICRORESONATOR

This publication has 1 reference indexed in Scilit:

CBE grown 1.5 μm GaInAsP/InP Surface Emitting Lasers
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005