Dominance of interface effects in SRO-SiO/sub 2/-SRO DEIS structures for EAROMs
- 1 October 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 35 (10) , 1645-1650
- https://doi.org/10.1109/16.7367
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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