Measurements of intense ion beams by a novel diagnostic method
- 1 November 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (11) , 7280-7289
- https://doi.org/10.1063/1.329877
Abstract
A new diagnostic method capable of measuring beam profiles and trajectories of intense ion beams as a function of time has been developed. The technique employs fast photography in conjunction with fast scintillators. Prior to detection, the excessive intensity of the direct ion beam is reduced by means of Rutherford scattering. A time resolution of a few nanoseconds and a spatial resolution of a few millimeters has been achieved. Using this technique focusing properties of planar and spherical pinch reflex diodes have been investigated. A low energy electron beam precursor has been detected. A simple model for its production is presented.This publication has 3 references indexed in Scilit:
- Saturation effects of organic scintillators to nanosecond-pulses of low-energy x-raysNuclear Instruments and Methods, 1979
- Production of Intense Proton Beams in Pinched-Electron-Beam DiodesPhysical Review Letters, 1976
- Propagation of High Current Relativistic Electron BeamsPhysics of Fluids, 1970