Single charged-particle damage to living cells: a new method based on track-etch detectors
- 1 November 1994
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 94 (3) , 251-258
- https://doi.org/10.1016/0168-583x(94)95363-5
Abstract
No abstract availableKeywords
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