Soft X-ray effects upon silicon-diode arrays aged in camera tubes
- 1 October 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 5 (5) , 261-265
- https://doi.org/10.1109/jssc.1970.1050124
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- The siilicon diode array camera tubePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1970
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- Influence of bulk and surface properties on the performance of silicon diode arrays for image sensingIEEE Transactions on Electron Devices, 1967
- Effects of ionizing radiation on oxidized silicon surfaces and planar devicesProceedings of the IEEE, 1967
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- Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditionsSolid-State Electronics, 1966
- Carrier Generation and Recombination in P-N Junctions and P-N Junction CharacteristicsProceedings of the IRE, 1957