Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays
- 8 November 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (19) , 2912-2914
- https://doi.org/10.1063/1.125225
Abstract
Because the refractive index for hard x rays is slightly different from unity, the optical phase of a beam is affected by transmission through an object. Phase images can be obtained with extreme instrumental simplicity by simple propagation provided the beam is coherent. But, unlike absorption, the phase is not simply related to image brightness. A holographic reconstruction procedure combining images taken at different distances from the specimen was developed. It results in quantitative phase mapping and, through association with three-dimensional reconstruction, in holotomography, the complete three-dimensional mapping of the density in a sample. This tool in the characterization of materials at the micrometer scale is uniquely suited to samples with low absorption contrast and radiation-sensitive systems.Keywords
This publication has 12 references indexed in Scilit:
- Fractional Talbot imaging of phase gratings with hard x raysOptics Letters, 1997
- Observation of microstructure and damage in materials by phase sensitive radiography and tomographyJournal of Applied Physics, 1997
- Quantitative Phase Imaging Using Hard X RaysPhysical Review Letters, 1996
- Wave function reconstruction in HRTEM: the parabola methodUltramicroscopy, 1996
- Phase–contrast X–ray computed tomography for observing biological soft tissuesNature Medicine, 1996
- Phase objects in synchrotron radiation hard x-ray imagingJournal of Physics D: Applied Physics, 1996
- On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiationReview of Scientific Instruments, 1995
- Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyPhysical Review Letters, 1992
- Improved high resolution image processing of bright field electron micrographs: I. TheoryUltramicroscopy, 1984
- AN X-RAY INTERFEROMETERApplied Physics Letters, 1965