Capacitance bridge for low-temperature, high-resolution dielectric measurements
- 1 January 1987
- journal article
- letter
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 58 (1) , 130-132
- https://doi.org/10.1063/1.1139540
Abstract
A stable capacitance bridge has been designed to measure changes both in capacitance and in loss of three‐terminal capacitors at temperatures ranging from 0.01 to 100 K. The circuit uses commercially available components, and has a resolution of better than 10−6. Also described is an anomalous voltage dependence present at low temperatures in capacitors which have electrodes applied using an evaporative or similar technique.Keywords
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