An XPS study of silicon/noble metal interfaces: Bonding trends and correlations with the Schottky barrier heights
- 31 March 1983
- journal article
- Published by Elsevier in Physica B+C
- Vol. 117-118, 831-833
- https://doi.org/10.1016/0378-4363(83)90666-6
Abstract
No abstract availableKeywords
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