Effect of Cs contamination on the interface state density of MNOS capacitors
- 1 October 1989
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 39 (1-4) , 356-363
- https://doi.org/10.1016/0169-4332(89)90450-9
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Interface States and Fixed Charges in MNOS Structures with APCVD and Plasma Silicon NitrideJournal of the Electrochemical Society, 1984
- Interface states on semiconductor/insulator surfacesC R C Critical Reviews in Solid State Sciences, 1976