Ferromagnetic resonance linewidth for NM/80NiFe/NM films (NM=Cu, Ta, Pd and Pt)
- 1 May 2001
- journal article
- Published by Elsevier in Journal of Magnetism and Magnetic Materials
- Vol. 226-230, 1640-1642
- https://doi.org/10.1016/s0304-8853(00)01097-0
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology
- New Energy and Industrial Technology Development Organization
This publication has 11 references indexed in Scilit:
- Extrinsic contributions to the ferromagnetic resonance response of ultrathin filmsPhysical Review B, 1999
- Magnetization Reversal in Micron-Sized Magnetic Thin FilmsPhysical Review Letters, 1998
- Correlations between ferromagnetic-resonance linewidths and sample quality in the study of metallic ultrathin filmsPhysical Review B, 1998
- Gilbert damping and g-factor in FexCo1−x alloy filmsSolid State Communications, 1995
- Ferromagnetic resonance linewidth of Fe ultrathin films grown on a bcc Cu substrateJournal of Applied Physics, 1991
- Ferromagnetic-resonance study of ultrathin bcc Fe(100) films grown epitaxially on fcc Ag(100) substratesPhysical Review Letters, 1987
- Ferromagnetic resonance studies of very thin cobalt films on a gold substratePhysical Review B, 1986
- Damping of ferromagnetic resonance in Ni-Fe alloysPhysica Status Solidi (a), 1976
- On the Landau–Lifshitz relaxation in ferromagnetic metalsCanadian Journal of Physics, 1970
- Ferromagnetic Resonance in Nickel Ferrite Between One and Two KilomegacyclesPhysical Review B, 1955