In Situ Monitoring of Diffuse Double Layer Structure Changes of Electrochemically Addressable Self-Assembled Monolayers with an Atomic Force Microscope
- 1 April 1999
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 15 (9) , 3343-3347
- https://doi.org/10.1021/la9813937
Abstract
No abstract availableKeywords
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