An analytical model for the aliasing probability in signature analysis testing
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 8 (11) , 1133-1144
- https://doi.org/10.1109/43.41499
Abstract
No abstract availableKeywords
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