Metal-semiconductor contacts
- 1 January 1982
- journal article
- Published by Institution of Engineering and Technology (IET) in IEE Proceedings I Solid State and Electron Devices
- Vol. 129 (1) , 1-14
- https://doi.org/10.1049/ip-i-1.1982.0001
Abstract
A review is given of our present knowledge of metal-semiconductor contacts. Topics covered include the factors that determine the height of the Schottky barrier, its current/voltage characteristics, and its capacitance. A short discussion is also given of practical contacts and their application in semiconductor technology, and a comparison is made with p-n junctions.Keywords
This publication has 3 references indexed in Scilit:
- Semiconductor Material Evaluation by Means of Schottky ContactsPublished by Springer Nature ,1979
- Introduction to Semiconductor HeterojunctionsPublished by Elsevier ,1972
- Rectifying Semiconductor ContactsJournal of the Electrochemical Society, 1956