SEMICONDUCTOR SURFACE THEORY CONCEPTS
- 1 January 1981
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
- Silicon gate technologySolid-State Electronics, 1970
- Silicon-gate technologyIEEE Spectrum, 1969
- Theoretical threshold voltages for MOS field effect transistorsSolid-State Electronics, 1968
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967
- Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized SiliconJournal of the Electrochemical Society, 1967
- Barrier energies in metal-silicon dioxide-silicon structuresJournal of Physics and Chemistry of Solids, 1966
- Ideal MOS Curves for SiliconBell System Technical Journal, 1966
- Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditionsSolid-State Electronics, 1966
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965
- Calculation of the Space Charge, Electric Field, and Free Carrier Concentration at the Surface of a SemiconductorJournal of Applied Physics, 1955