Barrier energies in metal-silicon dioxide-silicon structures
- 1 November 1966
- journal article
- Published by Elsevier in Journal of Physics and Chemistry of Solids
- Vol. 27 (11-12) , 1873-1879
- https://doi.org/10.1016/0022-3697(66)90118-1
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Photoemission of Electrons from Silicon and Gold into Silicon DioxidePhysical Review B, 1966
- Photoemission of Electrons from Silicon into Silicon DioxidePhysical Review B, 1965
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965
- Photoelectric Properties of Cleaved GaAs, GaSb, InAs, and InSb Surfaces; Comparison with Si and GePhysical Review B, 1965
- Photoemission Studies of Copper and Silver: TheoryPhysical Review B, 1964
- Barrier Height Studies on Metal-Semiconductor SystemsJournal of Applied Physics, 1963
- The Work Function of LithiumPhysical Review B, 1949