Local Electrode Atom Probes
- 29 February 2000
- journal article
- Published by Elsevier in Materials Characterization
- Vol. 44 (1-2) , 59-85
- https://doi.org/10.1016/s1044-5803(99)00055-8
Abstract
No abstract availableKeywords
This publication has 61 references indexed in Scilit:
- Atom probe analysis of planar multilayer structuresJournal of Applied Physics, 2000
- Development of the Scanning Atom Probe and Atomic Level AnalysisMaterials Characterization, 2000
- Field emitter tips for vacuum microelectronic devicesJournal of Vacuum Science & Technology A, 1990
- New scanning tunneling microscopy tip for measuring surface topographyJournal of Vacuum Science & Technology A, 1990
- Mosaic wedge-and-strip arrays for large format microchannel plate detectorsIEEE Transactions on Nuclear Science, 1989
- EFFECTS OF A GOLD SHANK-OVERLAYER ON THE FIELD ION IMAGING OF SILICONLe Journal de Physique Colloques, 1986
- Ion interaction with solids: Surface texturing, some bulk effects, and their possible applicationsJournal of Vacuum Science and Technology, 1981
- Sputtering—Surface changes induced by ion bombardmentProgress in Surface Science, 1976
- Premature field evaporation in the atom probeReview of Scientific Instruments, 1974
- Microtopography of surfaces eroded by ion-bombardmentJournal of Materials Science, 1969