Specific contact resistance using a circular transmission line model
- 31 May 1980
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 23 (5) , 487-490
- https://doi.org/10.1016/0038-1101(80)90086-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Measurement of mobility profiles in GaAs at room temperature by the Corbino effectSolid-State Electronics, 1978
- Ohmic Contacts to GaAs Transferred Electron DevicesJournal of the Electrochemical Society, 1978
- Improved noise performance of GaAs MESFET's with selectively ion-implanted n+source regionsIEEE Transactions on Electron Devices, 1977
- Auger Characterization of Chemically Etched GaAs SurfacesJournal of the Electrochemical Society, 1977