Accurate thermal noise model for deep-submicron CMOS
- 22 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 155-158
- https://doi.org/10.1109/iedm.1999.823868
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Accurate drain conductance modeling for distortion analysis in MOSFETsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An analytical thermal noise model of deep submicron MOSFET'sIEEE Electron Device Letters, 1999
- High-frequency noise measurements on FET's with small dimensionsIEEE Transactions on Electron Devices, 1986