Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh
- 1 July 1995
- journal article
- research article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 13 (4) , 1556-1559
- https://doi.org/10.1116/1.588186
Abstract
Sharp tips for various modern microscopies, such as field-ion microscopy (FIM) and scanning tunneling microscopy (STM), can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use. We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh using relatively benign solutions.This publication has 2 references indexed in Scilit:
- The art and science and other aspects of making sharp tipsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- An automatic electropolishing supervisor for preparing field ion microscope specimensJournal of Scientific Instruments, 1967